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ISBN 9781783265282
DDC 570.28
Tác giả CN Erni, Rolf
Nhan đề Aberration-corrected imaging in transmission electron microscopy : an introduction / Rolf Erni
Lần xuất bản 2nd ed.
Thông tin xuất bản London : Imperial College Press, 2015
Mô tả vật lý xviii, 413 pages. : illustrations (some color) ; 24 cm.
Tóm tắt Aberration-Corrected Imaging in Transmission Electron Microscopy provides an introduction to aberration-corrected atomic resolution electron microscopy in materials and physical sciences. It covers both the broad beam transmission mode (TEM; transmission electron microscopy) and the scanning transmission mode (STEM; scanning transmission electron microscopy). The book is structured in three parts. The first part introduces the basics of conventional atomic-resolution electron microscopy imaging in TEM and STEM modes. This part also describes limits of conventional electron microscopes and possible artefacts which are caused by the intrinsic lens aberrations that are unavoidable in such instruments. The second part introduces fundamental electron optical concepts and thus provides a brief introduction to electron optics. Based on the first and second parts of the book, the third part focuses on aberration correction; it describes the various aberrations in electron microscopy and introduces the concepts of spherical aberration correctors and advanced aberration correctors, including correctors for chromatic aberration. This part also provides guidelines on how to optimize the imaging conditions for atomic-resolution STEM and TEM imaging. This second edition has been completely revised and updated in order to incorporate the very recent technological and scientific achievements that have been realized since the first edition appeared in 2010
Từ khóa tự do Aberration-corrected imaging
Từ khóa tự do Electron microscopy
Từ khóa tự do Materials and structural analysis
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041 |aeng
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082 |a570.28|bE713|223
100 |aErni, Rolf
245 |aAberration-corrected imaging in transmission electron microscopy : |ban introduction / |cRolf Erni
250 |a2nd ed.
260 |aLondon : |bImperial College Press, |c2015
300 |axviii, 413 pages. : |billustrations (some color) ; |c24 cm.
520 |aAberration-Corrected Imaging in Transmission Electron Microscopy provides an introduction to aberration-corrected atomic resolution electron microscopy in materials and physical sciences. It covers both the broad beam transmission mode (TEM; transmission electron microscopy) and the scanning transmission mode (STEM; scanning transmission electron microscopy). The book is structured in three parts. The first part introduces the basics of conventional atomic-resolution electron microscopy imaging in TEM and STEM modes. This part also describes limits of conventional electron microscopes and possible artefacts which are caused by the intrinsic lens aberrations that are unavoidable in such instruments. The second part introduces fundamental electron optical concepts and thus provides a brief introduction to electron optics. Based on the first and second parts of the book, the third part focuses on aberration correction; it describes the various aberrations in electron microscopy and introduces the concepts of spherical aberration correctors and advanced aberration correctors, including correctors for chromatic aberration. This part also provides guidelines on how to optimize the imaging conditions for atomic-resolution STEM and TEM imaging. This second edition has been completely revised and updated in order to incorporate the very recent technological and scientific achievements that have been realized since the first edition appeared in 2010
541 |aTặng
653 |aAberration-corrected imaging
653 |aElectron microscopy
653 |aMaterials and structural analysis
852|a300|bQ12_Kho Mượn_02|j(1): 099794
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